Manoj Sachdev

Manoj Sachdev from the University of Waterloo, Waterloo, ON, Canada was named Fellow of the Institute of Electrical and Electronics Engineers in 2012 for contributions to test methodology for very large scale integrated circuits.

Ebooks

Defect Oriented Testing for CMOS Analog and Digital Circuits

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: Edition 2

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test