Testing of Digital Systems
N. K. Jha · S. Gupta
2003年5月 · Cambridge University Press
3.5star
2則評論report
電子書
1022
頁
report評分和評論未經驗證 瞭解詳情
關於本電子書
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
評分和評論
3.5
2則評論
關於作者
Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.
Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.
為這本電子書評分
歡迎提供意見。
閱讀資訊
智慧型手機與平板電腦
筆記型電腦和電腦
你可以使用電腦的網路瀏覽器聆聽你在 Google Play 購買的有聲書。
電子書閱讀器與其他裝置
如要在 Kobo 電子閱讀器這類電子書裝置上閱覽書籍，必須將檔案下載並傳輸到該裝置上。請按照說明中心的詳細操作說明，將檔案傳輸到支援的電子閱讀器上。
