Semiconductor Device Reliability
A. Christou · B.A. Unger
dec. 2012 · NATO Science Series E Bok 175 · Springer Science & Business Media
E-bok
575
Sidor
reportBetyg och recensioner verifieras inte Läs mer
Om den här e-boken
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.
Betygsätt e-boken
Berätta vad du tycker.
Läsinformation
Smartphones och surfplattor
Installera appen Google Play Böcker för Android och iPad/iPhone. Appen synkroniseras automatiskt med ditt konto så att du kan läsa online eller offline var du än befinner dig.
Laptops och stationära datorer
Du kan lyssna på ljudböcker som du har köpt på Google Play via webbläsaren på datorn.
Läsplattor och andra enheter
Om du vill läsa boken på enheter med e-bläck, till exempel Kobo-läsplattor, måste du ladda ned en fil och överföra den till enheten. Följ anvisningarna i hjälpcentret om du vill överföra filerna till en kompatibel läsplatta.
